Dynamic Image Analysis (DIA) is a powerful state-of-the-art method for particle size and shape characterization of powders, granules and suspensions.
RETSCH Technology’s particle analyzers CAMSIZER P4 and CAMSIZER X2 use the principle of Dynamic Image Analysis. Thanks to the patented dual camera technology these analyzers cover a wide dynamic measuring range from 20 µm to 30 mm and from 0.8 µm to 8 mm respectively. The dual camera technology is based on the simultaneous operation of two cameras, allowing for the detection of fine as well as coarse particles in a wide measuring range with high resolution and efficiency.
Dynamic Image Analysis is used for quality and process control in many different industries and for a great variety of applications. Thanks to its superior features, DIA often replaces conventional methods like sieve analysis or laser diffraction. Compared to these methods, image analysis offers a number of advantages: a wealth of different size and shape parameters are obtained with high precision from every single particle image. Hence, the resolution of the measurement results is greatly superior to that of other technologies.
Measuring principle: Dynamic Image Analysis (ISO 13322-2)
Measuring range: Standard 0.8 µm to 8 mm 10 µm to 8 mm (gravity dispersion) 0.8 µm to 5 mm (air pressure dispersion) 0.8 µm to 1 mm (wet dispersion) extended measuring ranges click here for more information
Type of analysis: dry and wet analysis
Dynamic Image Analysis: Technological Basics
Dynamic Image Analysis analyzes the shadow projections of particles. Both the CAMSIZER P4 and CAMSIZER X2 transform grayscale images through a multistep algorithm into binary images to determine the exact outlines.
All particle size and particle shape parameters are measured on this basis. The values of the single measurements are assigned to 10,000 size classes during the measurement, providing an extremely high resolution.
Size and Shape Parameters of Dynamic Image Analysis (DIA)
Imaging methods offer the crucial advantage of using various size definitions, allowing for direct length and shape measurement.
Depending on the application, a variety of size parameters may be of interest:
If, for example, elongated particles such as cellulose fibers, catalyst rods, plastic extrudates or rice grains are analyzed, the length of the particles is the relevant parameter.
If, however, the sample needs to be compared to a sieve analysis, the focus is on particle width as the particles’ orientation allows them to pass the sieve apertures with their smallest projection area.
In Dynamic Image Analysis particle size distributions are based on different size definitions. The parameter xc min defines the particle width, xFe max describes the length. Consequently, the xFe max result is bigger than xc min. The size definition xarea is based on the calculation of a circle with equivalent surface from each particle.
Measuring Range of Dynamic Image Analysis (DIA)
The lower and upper limits of the measurement range of image analysis systems are determined by various factors (see ISO 13322-1 and -2). The lower limit is defined by the resolution of the camera. The decisive criterion is the smallest particle size which the optics can still reproduce on a single pixel (= picture element) on the camera chip.
The reproduction scale is ascertained with the help of calibration objects with exactly defined dimensions. The smallest measurable particle shadows at least half a pixel on the camera chip and this size is usually defined as the detection limit or lower limit of the measuring range.
The upper limit of the measuring range of DIA analyzers is determined by the field of view of the cameras.
Particle projections on the edge of the field of view have to be rejected because the correct particle size cannot be determined. This results in larger particles being underrepresented as they are more likely to be located near the edge. The software of the CAMSIZER systems features an algorithm in accordance with ISO 13322-1 which compensates for this effect, which ensures that the percentage of large particles is correctly represented.