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Retsch Technology > RT > Products > Laser Light Scattering

Laser Light Scattering

The most important methods for the characterization of particles in the nanometer and micrometer range are dynamic and static laser light scattering (laser diffraction). The static laser light scattering can be used for the analysis of  emulsions, suspensions and dry samples.


Particle Analyzer HORIBA LA-950
  • Measuring principle: Mie Scattering Theory according ISO 13320
  • Measuring range: 0.01 µm - 3000 µm
  • Type of analysis: Dry and wet analysis
Particle Analyzer HORIBA LA-300
  • Measuring principle: Mie Scattering Theory according ISO 13320
  • Measuring range: 0.1 µm - 600 µm
  • Type of analysis: Wet analysis
Nano Particle AnalyzerHORIBA LB-550V
  • Measuring principle: Dynamic Light Scattering
  • Measuring range: 1 nm - 6000 nm
  • Type of analysis: Wet analysis
Nano Particle AnalyzerHORIBA LB-550S
  • Measuring principle: Dynamic Light Scattering
  • Measuring range: 1 nm - 6000 nm
  • Type of analysis: Wet analysis



Retsch Technology is the exclusive distributor of Horiba particle analyzers for Germany, Switzerland, Austria, Netherlands and Belgium.
For other countries please find your local contact at  horiba-particle.com.