Milling and Sieving
Home
Retsch Technology > RT > Products > Laser Light Scattering

Laser Light Scattering

The most important methods for the characterization of particles in the nanometer and micrometer range are dynamic and static laser light scattering (laser diffraction). The static laser light scattering can be used for the analysis of emulsions, suspensions and dry samples.


Particle Analyzer
HORIBA LA-950

 

Particle Analyzer
HORIBA LA-300
Particle Analyzer<br> HORIBA LA-950   Particle Analyzer <br>HORIBA LA-300
  • Measuring principle: Mie Scattering Theory according ISO 13320
  • Measuring range: 0.01 µm - 3000 µm
  • Type of analysis: dry and wet analysis
  
  • Measuring principle: Mie Scattering Theory
  • Measuring range: 0.1 µm - 600 µm
  • Type of analysis: wet analysis
     

Nano Particle Analyzer
HORIBA SZ-100

    
Nano&nbsp;Particle Analyzer<br /> HORIBA SZ-100    
  • Measuring principle:
  • - Particle size: Photon Correlation Spectroscopy
  • - Molecular weight: Debye plot method (static light scattering)
  • - Zeta potential: Laser Doppler electrophoresis
  • Measuring range:
  • - Particle size: 0.3 nm - 8 µm
  • - Molecular weight: 1 x 10^3 - 2x 10^7 g/mol
  • - Zeta potential: -200 mV to +200 mv
    
     

*depending on feed material and instrument configuration/settings

Subscribe to Newsletter


Brochures

Testimonials

Retsch Technology is the exclusive distributor of Horiba particle analyzers for Germany, Switzerland and Austria.
For other countries please find your local contact at  horiba-particle.com.