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Laser Light Scattering

The most important methods for the characterization of particles in the nanometer and micrometer range are dynamic and static laser light scattering (laser diffraction). The static laser light scattering can be used for the analysis of  emulsions, suspensions and dry samples.

Particle Analyzer
HORIBA LA-950

 

Particle Analyzer
HORIBA LA-300

Particle Analyzer<br> HORIBA LA-950   Particle Analyzer <br>HORIBA LA-300
  • Measuring principle: Mie Scattering Theory according ISO 13320
  • Measuring range: 0.01 µm - 3000 µm
  • Type of analysis: Dry and wet analysis
 
  • Measuring principle: Mie Scattering Theory according ISO 13320
  • Measuring range: 0.1 µm - 600 µm
  • Type of analysis: Wet analysis
     

Nano Particle Analyzer
HORIBA LB-550V

 

Nano Particle Analyzer
HORIBA LB-550S

Nano Particle Analyzer<br>HORIBA LB-550V   Nano Particle Analyzer<br>HORIBA LB-550S
  • Measuring principle: Dynamic Light Scattering
  • Measuring range: 1 nm - 6000 nm
  • Type of analysis: Wet analysis
 
  • Measuring principle: Dynamic Light Scattering
  • Measuring range: 1 nm - 6000 nm
  • Type of analysis: Wet analysis
     

*depending on feed material and instrument configuration/settings

Retsch Technology is the exclusive distributor of Horiba particle analyzers for Germany, Switzerland and Austria.
For other countries please find your local contact at  horiba-particle.com.