- Particle analysis
- Particle shape
- Laser diffraction
- Dynamic light scattering
- Particle size
- Analysis instruments
- Particle analyzer
- Particle size analysis
- Particle sizing
- Particles
- Particle characterization
Particle sizing improved through light scattering or image analysis
Click here for detailed information about particle sizing with Retsch Technology
Image analysis and light scattering techniques utilized in particle sizing systems has given way to a rapid detection that reduces sample process time and provides precise results.
Traditional sieving analysis provides an economical and simple solution to many characterization scenarios for larger grain size materials. However, advanced image analysis particle sizing systems provide higher resolution along with better repeatability and the possibility of particle shape analysis.
Laser light scattering techniques allow detection of particles in the micro- or nanometer range. The sample material can be a dry powder, suspension or emulsion. The flexible software manages signals to provide virtually simultaneous tabular or graphical results of the scanning procedure. System components have evolved, increasing overall accuracy and reducing the physical device footprint, making them useful in tighter laboratory environments, whereas the improved speed and performance is appealing in quality control situations.
Additionally, Retsch Technology's industry proven particle sizing instruments have been time tested to be rigid and reliable.
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